Starch granule surface imaging using low-voltage scanning electron microscopy and atomic force microscopy

被引:58
|
作者
Baldwin, PM [1 ]
Davies, MC [1 ]
Melia, CD [1 ]
机构
[1] UNIV NOTTINGHAM,DEPT PHARMACEUT SCI,LAB BIOPHYS & SURFACE ANAL,NOTTINGHAM NG7 2RD,ENGLAND
关键词
starch; atomic-force; microscopy;
D O I
10.1016/S0141-8130(97)00048-2
中图分类号
Q5 [生物化学]; Q7 [分子生物学];
学科分类号
071010 ; 081704 ;
摘要
High resolution imaging of wheat and potato starch granule surfaces has been performed using low-voltage scanning electron microscopy and atomic force microscopy. The complimentary images of uncoated granules demonstrate that the two starch types possess substantially different surface topologies; potato starch has many protrusions (100-300 nm in diameter), above a flatter surface containing 20-50 nm structures, whilst wheat starch possesses far fewer protrusions and generally has a smoother surface composed of approximate to 20 nm structures. The protrusions are believed to be carbohydrate in nature and thus represent the ends of amylopectin side-chain clusters at the granule surface. (C) 1997 Elsevier Science B.V.
引用
收藏
页码:103 / 107
页数:5
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