Effects of metal ion adsorption on colloidal surface forces: Measurements by atomic force microscopy

被引：0
|
作者：
Chin, CJ [1 ]
Yiacoumi, S [1 ]
Tsouris, C [1 ]
机构：
[1] Georgia Inst Technol, Sch Civil & Environm Engn, Atlanta, GA 30332 USA
来源：
PROTECTION AND RESTORATION OF THE ENVIRONMENT VI, VOLS I - III, PROCEEDINGS | 2002年
关键词：
D O I：
暂无
中图分类号：
X [环境科学、安全科学];
学科分类号：
08 ; 0830 ;
摘要：
Surface forces between a silica colloidal particle and a smooth glass plate are directly measured using atomic force microscopy. The effects of adsorption of copper ions on the surface forces are examined. At intermediate pH, adsorption of copper ions causes charge reversal for the silica particle from negative to positive and, therefore, the force between the silica particle and the glass plate changes from repulsive to attractive. The transient zeta-potential of the silica particle during adsorption of copper ions is determined by describing the experimental results using the Derjaguin-Landau-Verwey-Overbeek theory.
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页码：1785 / 1793
页数：9
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