Temperature Dependence in the Long-Term Stability of the TlBr Detector

被引：12

作者：

da Costa, Fabio Eduardo ^{[1
]}

de Mesquita, Carlos Henrique ^{[1
]}

Hamada, Margarida Mizue ^{[1
]}

机构：

[1] CNEN SP, IPEN, BR-05508900 Sao Paulo, Brazil

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2009年 / 56卷 / 04期

基金：

巴西圣保罗研究基金会;

关键词：

Detector stability; polarization; semiconductor detector; Thallium bromide;

D O I：

10.1109/TNS.2009.2024678

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, TlBr detectors with three-electrodes were prepared and their long term stability evaluated as a function of the temperature. Systematic measurements of counting rate were carried out to observe the random pulse formation, due to the polarization effect. Three-electrode detectors presented stability of about 112 h at near room temperature and more than 325 h at 0 degrees C Although the three-electrode detector presents a better performance compared to the two-electrode detector, its stability has been still dependent on the temperature.

引用

页码：1817 / 1822

页数：6

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