Application of electron back-scatter diffraction to grain boundary surfaces.

被引：0

作者：

Randle, V. ^{[1
]}

Davies, H. ^{[1
]}

Wilson, R. ^{[1
]}

Pearce, I. ^{[1
]}

机构：

[1] Univ Wales Swansea, Dept Mat Engn, Swansea SA2 8PP, W Glam, Wales

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2000年 / 56卷

关键词：

grain boundary; EBSD; serial sectioning;

D O I：

10.1107/S0108767300021887

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

s7.m2.o2

引用

页码：S50 / S50

页数：1

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