Application of electron back-scatter diffraction to grain boundary surfaces.

被引：0
|
作者：
Randle, V. [1 ]
Davies, H. [1 ]
Wilson, R. [1 ]
Pearce, I. [1 ]
机构：
[1] Univ Wales Swansea, Dept Mat Engn, Swansea SA2 8PP, W Glam, Wales
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2000年 / 56卷
关键词：
grain boundary; EBSD; serial sectioning;
D O I：
10.1107/S0108767300021887
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
s7.m2.o2
引用
收藏
页码：S50 / S50
页数：1
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