Growth and surface morphologies of 6H SiC bulk and epitaxial crystals

被引:1
作者
Dhanaraj, Govindhan [1 ]
Chen, Yi
Dudley, Michael
Zhang, Hui
机构
[1] SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USA
[2] SUNY Stony Brook, Dept Mech Engn, Stony Brook, NY 11794 USA
来源
SILICON CARBIDE AND RELATED MATERIALS 2005, PTS 1 AND 2 | 2006年 / 527-529卷
关键词
crystal growth; vapor growth; chemical vapor deposition; CVD; physical vapor transport; PVT; etching; X-ray topography; dislocations; micropipes;
D O I
10.4028/www.scientific.net/MSF.527-529.67
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Bulk crystals and epitaxial layers of 6H SiC have been grown and their surface morphologies have been investigated. Seeded sublimation has been employed to obtain bulk 6H SiC crystals whereas a silicon tetrachloride-propane based chemical vapor deposition (CVD) was used for growing epitaxial layers. The hot-zones were designed using numerical simulation. Growth rates up to 200 mu m/hr could be achieved in the CVD process. A new growth-assisted hydrogen etching was developed to reveal the distribution of the micropipes present in the substrate. Morphological features were studied using Nomarski, atomic force microscopy (AFM), and scanning electron microscopy (SEM), and the structural quality was evaluated using synchrotron X-ray topography.
引用
收藏
页码:67 / 70
页数:4
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