Experimental Study on Power Consumption in Lifetime Engineered Power Diodes

被引：25

作者：

Daliento, Santolo ^{[1
]}

Mele, Luigi ^{[1
]}

Spirito, Paolo ^{[1
]}

Carta, Rossano ^{[2
]}

Merlin, Luigi ^{[2
]}

机构：

[1] Univ Naples Federico II, Dept Elect Engn, I-80125 Naples, Italy

[2] Vishay Semicond Italiana, I-10071 Borgaro, Italy

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 2009年 / 56卷 / 11期

关键词：

Helium; lifetime; platinum; power diodes; I-N-DIODE;

D O I：

10.1109/TED.2009.2031005

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, we present a quantitative study of the effects of lifetime engineering treatments on the switching operation of power diodes, with special regards to the whole energy consumption. Not only single platinum diffusion and helium implantation processes, but also the combined effects for both treatments have been analyzed. Results show that care must be taken when choosing the lifetime treatment because univocal rules are difficult to draw.

引用

页码：2819 / 2824

页数：6

共 9 条

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