Intrinsic Josephson junctions in Bi2212 and Bi2223 intergrowth films

被引：2

作者：

Qi, Y ^{[1
]}

Sakai, K ^{[1
]}

Murakami, H ^{[1
]}

Aoki, R ^{[1
]}

Ito, T ^{[1
]}

机构：

[1] Osaka Univ, Dept Elect Engn, Suita, Osaka 5650871, Japan

来源：

THIN SOLID FILMS | 2000年 / 366卷 / 1-2期

关键词：

superconductivity; surface morphology; intergrowth film; intrinsic Josephson;

D O I：

10.1016/S0040-6090(00)00747-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Intergrowth films containing Bi2212 and Bi2223 were fabricated by means of a reactive co-deposition method. These films were deposited under the supply of highly condensed ozone lover 95%) on a Bi2201/Bi2212 buffer layer that was grown on the MgO (100) substrate. The (Bi2212 + Bi2223) intergrowth film exhibits resistive superconductivity at T-c,T-zero = 80 K. The temperature dependence of I-V characteristic along the crystal c-axis of this intergrowth film showed a weak-link Josephson tunneling process well explained by Ambegaokar-Baratoff's theory, in which the maximum supercurrent I-c is as large as 100 mA at T = 4.2 K. (C) 2000 Elsevier Science S.A. All rights reserved.

引用

页码：77 / 81

页数：5

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