A 1-GS/s 11-bit ADC with 55-dB SNDR, 250-mW power realized by a high bandwidth scalable time-interleaved architecture

被引:63
作者
Gupta, Sandeep K. [1 ]
Inerfield, Michael A. [1 ]
Wang, Jingbo [1 ]
机构
[1] Teranet Inc, Santa Clara, CA 95054 USA
关键词
analog-to-digital conversion; double-sampling; ENOB; figure of merit (FOM); high-accuracy ADC; high-speed ADC; offset and gain error; phase skew correction; pipeline ADC; sampling networks; switched-capacitor circuits; time-interleaving; timing;
D O I
10.1109/JSSC.2006.884331
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A time-interleaved ADC architecture that eliminates the need to correct timing offsets and is yet scalable to high sampling rates is presented. To eliminate timing skews, a Nyquist rate sampling switch is used, which is followed by subsampled, double-sampled time-interleaved sample-and-hold (SIH) stages. This circuit is configured with a special clocking scheme that reduces the loading of the interleaved S/Hs on the Nyquist rate sampling switch, making this scalable to high sampling rates. The subsampled ADCs. (sub-ADCs) in this design use a 3.5-bit/stage pipelined architecture. This 1-GS/s 11-bit ADC achieves 55-dB peak SNDR, 58.6-dB SNR, consumes 250-mW core power, and occupies a core area of 3.5 mm(2). This circuit is implemented in a dual-gate 1.2 V/2.5 V, 0.13-mu m logic CMOS process.
引用
收藏
页码:2650 / 2657
页数:8
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