Adaptable Optical Fiber Displacement-Curvature Sensor Based on a Modal Michelson Interferometer with a Tapered Single Mode Fiber

被引:24
|
作者
Salceda-Delgado, G. [1 ]
Martinez-Rios, A. [2 ]
Selvas-Aguilar, R. [1 ]
Alvarez-Tamayo, R. I. [3 ]
Castillo-Guzman, A. [1 ]
Ibarra-Escamilla, B. [4 ]
Duran-Ramirez, V. M. [5 ]
Enriquez-Gomez, L. F. [2 ,6 ]
机构
[1] Univ Autonoma Nuevo Leon, Pedro de Alba S-N,Ciudad Univ, San Nicolas De Los Garza 66455, Nuevo Leon, Mexico
[2] Ctr Invest Opt AC, Loma Bosque 115, Leon 37150, Gto, Mexico
[3] Univ Autonoma Nuevo Leon, CONACYT, Fac Ciencias Fis Matemat, San Nicolas De Los Garza 66455, Nuevo Leon, Mexico
[4] INAOE, LE Erro 1, Sta Ma Tonantzintla 72824, Puebla, Mexico
[5] Univ Guadalajara, Ctr Univ Lagos, Enrique Diaz de Leon 1144, Lagos De Moreno 47460, Jalisco, Mexico
[6] Inst Tecnol Aguascalientes, Ave Adolfo Lopez Mateos 1801, Aguascalientes 20256, Ags, Mexico
来源
SENSORS | 2017年 / 17卷 / 06期
关键词
fiber optic sensor; modal optical fiber Michelson interferometer; displacement-curvature measurement; TEMPERATURE;
D O I
10.3390/s17061259
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
A compact, highly sensitive optical fiber displacement and curvature radius sensor is presented. The device consists of an adiabatic bi-conical fused fiber taper spliced to a single-mode fiber (SMF) segment with a flat face end. The bi-conical taper structure acts as a modal coupling device between core and cladding modes for the SMF segment. When the bi-conical taper is bent by an axial displacement, the symmetrical bi-conical shape of the tapered structure is stressed, causing a change in the refractive index profile which becomes asymmetric. As a result, the taper adiabaticity is lost, and interference between modes appears. As the bending increases, a small change in the fringe visibility and a wavelength shift on the periodical reflection spectrum of the in-fiber interferometer is produced. The displacement sensitivity and the spectral periodicity of the device can be adjusted by the proper selection of the SMF length. Sensitivities from around 1.93 to 3.4 nm/mm were obtained for SMF length between 7.5 and 12.5 cm. Both sensor interrogations, wavelength shift and visibility contrast, can be used to measure displacement and curvature radius magnitudes.
引用
收藏
页数:8
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