Porous silicon as a sacrificial layer in production of silicon diaphragms by precision grinding

被引:0
作者
Prochaska, A [1 ]
Mitchell, SJN [1 ]
Gamble, HS [1 ]
机构
[1] Queens Univ Belfast, Sch Elect Engn, Belfast BT7 1NN, Antrim, North Ireland
来源
MATERIALS & PROCESS INTEGRATION FOR MEMS | 2002年 / 9卷
关键词
porous silicon; precision grinding; silicon diaphragm;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This chapter discusses the use of porous silicon as a sacrificial supporting layer during silicon diaphragm formation by precision grinding. Unsupported silicon diaphragms formed by grinding exhibit post-grinding shape distortion dependent upon diaphragm thickness and diameter. Such distortion can be eliminated or strongly suppressed by use of a support during the grinding process. Use of porous silicon as in-situ support for 15 - 150 mum thick diaphragms is explained with emphasis on porous silicon properties, diaphragm thickness and fabrication processing steps such as oxidation.
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页码:27 / 50
页数:24
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