The influence of different doping elements on microstructure, piezoelectric coefficient and resistivity of sputtered ZnO film

被引:108
作者
Wang, X. B. [1 ]
Song, C. [1 ]
Li, D. M. [1 ]
Geng, K. W. [1 ]
Zeng, F. [1 ]
Pan, F. [1 ]
机构
[1] Tsinghua Univ, Lab Adv Mat, Dept Mat Sci & Engn, Beijing 100084, Peoples R China
基金
中国国家自然科学基金;
关键词
doping element; ZnO film; piezoelectric coefficient; electrical resistivity; ACOUSTIC-WAVE DEVICES; ZINC-OXIDE; THIN-FILMS; QUANTITATIVE XPS; GROWTH; DEPOSITION;
D O I
10.1016/j.apsusc.2006.02.059
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
ZnO film is attractive for high frequency surface acoustic wave device application when it is coupled with diamond. In order to get good performance and reduce insertion loss of the device, it demands the ZnO film possessing high electrical resistivity and piezoelectric coefficient d(33). Doping ZnO film with some elements may be a desirable method. In this paper, the ZnO films undoped and doped with Cu, Ni, Co and Fe, respectively (doping concentration is 2.0 at.%) are prepared by magnetron sputtering. The effect of different dopants on the microstructure, piezoelectric coefficient d(33), and electrical resistivity of the film are investigated. The results indicate that Cu dopant can enhance the c-axis orientation and piezoelectric coefficient d(33), the Cu and Ni dopant can increase electrical resistivity of the ZnO film up to 10(9) Omega cm. It is promising to fabricate the ZnO films doped with Cu for SAW device applications. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:1639 / 1643
页数:5
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