A survey of forensic characterization methods for physical devices

被引：55

作者：

Khanna, Nitin ^{[1
]}

Mikkilineni, Aravind K.

Martone, Anthony F.

Ali, Gazi N.

Chiu, George T. -C.

Allebach, Jan P.

Delp, Edward J.

机构：

[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA

[2] Purdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USA

来源：

DIGITAL INVESTIGATION | 2006年

基金：

美国国家科学基金会;

关键词：

device forensics; camera identification; printer identification; RF device identification;

D O I：

10.1016/j.diin.2006.06.014

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper describes methods for forensic characterization of physical devices. This is important in verifying the trust and authenticity of data and the device that created it. Current forensic identification techniques for digital cameras, printers, and RF devices are presented. It is also shown how these techniques can fit into a general forensic characterization framework, which can be generalized for use with other devices. (c) 2006 DFRWS. Published by Elsevier Ltd. All rights reserved.

引用

页码：S17 / S28

页数：12

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