Experimental evaluation of scan tests for bridges

被引：24
作者：
Chakravarty, S [1 ]
Jain, A [1 ]
Radhakrishnan, N [1 ]
Savage, EW [1 ]
Zachariah, TS [1 ]
机构：
[1] Intel Corp, Santa Clara, CA 95051 USA
来源：
INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS | 2002年
关键词：
D O I：
10.1109/TEST.2002.1041801
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
An impressive body of theoretical research to model the behavior of bridges exits. We take that a step further and describe an experiment to compute single cycle scan tests for bridges and evaluate them in silicon. Experimental data, on a high volume part, shows that by marginally increasing the static bridge fault coverage of realistic bridges, unique parts missed by a comprehensive set of stuck-at tests were detected. We believe that this is the first silicon data on the value of adding single cycle scan tests for bridges to the manufacturing flow.
引用
收藏
页码：509 / 518
页数：10
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