Magnetoresistance measurement of permalloy thin film rings with triangular fins

被引:8
作者
Lai, Mei-Feng [1 ]
Hsu, Chia-Jung [1 ]
Liao, Chun-Neng [1 ]
Chen, Ying-Jiun [1 ]
Wei, Zung-Hang [2 ]
机构
[1] Natl Tsing Hua Univ, Inst NanoEngn & MicroSyst, Hsinchu 300, Taiwan
[2] Natl Tsing Hua Univ, Dept Power Mech Engn, Hsinchu 300, Taiwan
关键词
Magnetoresistance; Magnetization reversal; Permalloy;
D O I
10.1016/j.jmmm.2009.08.036
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Magnetization reversals in permalloy rings controlled by nucleation sites using triangular fins at the same side and diagonal with respect to the field direction are demonstrated by magnetoresistance measurement and micromagnetic simulation. In the ring with triangular fins at the same side, there exists two-step reversal from onion to flux-closure state (or vortex state) and then from flux-closure (or vortex state) to reverse onion state; in the ring with diagonal triangular fins, one-step reversal occurs directly from onion to reverse onion state. The reversal processes are repeatable and controllable in contrast to an ideal ring without triangular fins where one-step and two-step reversals occur randomly in sweep-up and sweep-down processes. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:92 / 96
页数:5
相关论文
共 50 条
[21]   CRYSTAL STRUCTURE, PHASE STATE, AND MAGNETORESISTIVE PROPERTIES OF NANOSTRUCTURED THIN-FILM SYSTEMS BASED ON PERMALLOY AND NOBLE METALS [J].
Pazukha, I. M. ;
Shkurdoda, Yu. O. .
USPEKHI FIZIKI METALLOV-PROGRESS IN PHYSICS OF METALS, 2022, 23 (04) :613-628
[22]   Mathematical modeling of electrodeposition of permalloy thin film I. direct current plating [J].
S.-K Doo ;
H.-J Sohn ;
T. Kang .
Metals and Materials, 1999, 5 :451-457
[23]   In situ investigation of the magnetic domain wall in Permalloy thin film by Lorentz electron microscopy [J].
Liu, H. H. ;
Duan, X. K. ;
Che, R. C. ;
Wang, Z. F. ;
Duan, X. F. .
MATERIALS LETTERS, 2008, 62 (17-18) :2654-2656
[24]   Study of giant magnetoresistance and giant electroresistance of carbon based thin film [J].
ZHANG Xiaozhong TIAN Peng and XUE Qingzhong Laboratory of Advanced Materials Department of Materials Science and Engineering Tsinghua University Beijing China College of Physics Science and Technology China University of Petroleum Dongying China .
RareMetals, 2006, (S1) :617-620
[25]   Study of giant magnetoresistance and giant electroresistance of carbon based thin film [J].
Zhang Xiaozhong ;
Tian Peng ;
Xue Qingzhong .
RARE METALS, 2006, 25 :617-620
[26]   Ballistic magnetoresistance of electrodeposited nanocontacts in thin film and micrometer wire gaps [J].
Garcia, N ;
Cheng, H ;
Wang, H ;
Nikolic, ND ;
Guerrero, CA ;
Papageorgopoulos, AC .
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2004, 272 :1722-1729
[27]   Mathematical modeling of electrodeposition of permalloy thin film II. pulsed current plating [J].
S.-K Doo ;
H.-J Sohn ;
T. Kang .
Metals and Materials, 1999, 5 :459-463
[28]   Mathematical modeling of electrodeposition of permalloy thin film II. Pulsed current plating [J].
Doo, SK ;
Sohn, HJ ;
Kang, T .
METALS AND MATERIALS-KOREA, 1999, 5 (05) :459-463
[29]   Ultra-thin chip with permalloy film for high performance MS/RF CMOS [J].
Ohguro, T ;
Sato, N ;
Matsuo, M ;
Kojima, K ;
Momose, HS ;
Ishimaru, K ;
Ishiuchi, H .
2004 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS, 2004, :220-221
[30]   First-principles calculations of permalloy thin film on SrTiO3 substrate [J].
He, Jiawei ;
He, Jiali ;
Chen, Bo ;
Zhang, Yongmei .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2025, 58 (07)