Refinement of major- and minor-element PIXE analysis of rocks and minerals

被引:22
作者
Heirwegh, Christopher M. [1 ]
Campbell, John L. [1 ]
Czamanske, Gerald K. [2 ,3 ]
机构
[1] Univ Guelph, Guelph Waterloo Phys Inst, Guelph, ON N1G 2W1, Canada
[2] US Geol Survey, 345 Middlefield Rd, Menlo Pk, CA 94025 USA
[3] 750 West Greenwich Pl, Palo Alto, CA 94303 USA
基金
加拿大自然科学与工程研究理事会;
关键词
PIXE; Geochemistry; Standardization; Accuracy; Detector linearity; SILICATE MINERALS; MICRO-PIXE; RAY; STANDARDS; ENERGIES;
D O I
10.1016/j.nimb.2015.10.018
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An attempt has been made to assess the accuracy of the particle-induced X-ray emission (PIXE) fundamental parameters with standards approach to quantifying major- and minor-element constituents of silicate glasses and minerals. A deviation from linearity at low energies in the channel-energy calibration relationship was identified as a source of undesired residues in GUPIX-fitting. A correction for this effect was developed using a general-purpose spectrum fitting program and was incorporated in GUPIX. The PIXE spectra of sixteen well-characterized electron microprobe standards were then processed. Complementary electron probe micro-analysis (EPMA) measurements were used to support the comparison of the PIXE results with previous characterizations. Major element concentrations were found to differ on average from literature values as follows: SiO2 (-0.28 +/- 0.12%), Al2O3 (0.72 +/- 0.74%), MgO (0.11 +/- 0.63%), Na2O (-2.6 +/- 1.2%), K2O (1.1 +/- 0.7%), Cab (-0.35 +/- 0.37%), TiO2 (2.5 +/- 1.9%), MnO (0.8 +/- 4.7%), FeO (0.98 +/- 0.93%). These results indicate that major and minor elemental analysis can be achieved with high accuracy using the present Guelph micro-PIXE setup. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:40 / 50
页数:11
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