Some improvements for coincidence electron microscope and observation of coincidence image

被引：0
作者：
Yasuno, M
Kimura, Y
Shimizu, R
机构：
来源：
OPTIK | 1997年 / 106卷 / 01期
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D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A coincidence electronics system has been newly reconstructed for a coincidence electron microscope. This electronics enables the coincidence detection of the characteristic X-ray signals From an energy dispersive X-ray Si(Li) detector and of those transmitted electrons that generated the X-rays to be performed with sufficient accuracy, leading to realization of a coincidence electron microscope. An observation of coincidence electron microscopic image is also presented.
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页码：19 / 27
页数：9
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