Interconnect RL extraction based on transfer characteristics of transmission-line

被引:0
作者
Tsuchiya, Akira [1 ]
Hashimoto, Masanori
Onodera, Hidetoshi
机构
[1] Kyoto Univ, Dept Commun & Comp Engn, Kyoto 6068501, Japan
[2] Osaka Univ, Dept Informat Syst Engn, Suita, Osaka 5650871, Japan
关键词
parameter extraction; transmission-line; frequency dependence;
D O I
10.1093/ietfec/e89-a.12.3585
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper proposes a method to determine a single frequency for interconnect RL extraction. Resistance and inductance of interconnects depend on frequency, and hence the extraction frequency strongly affects the modeling accuracy of interconnects. The proposed method determines an extraction frequency based on the transfer characteristic of interconnects. By choosing the frequency where the transfer characteristic becomes maximum, the extracted RL values achieve the accurate modeling of the waveform. Experimental results show that the proposed method provides accurate transition waveforms over various interconnect topologies.
引用
收藏
页码:3585 / 3593
页数:9
相关论文
共 15 条
[1]  
[Anonymous], 2003, INT TECHN ROADM SEM
[2]  
*AV CORP, 1998, RAPH REF MAN REL 4 2
[3]  
Bakoglu H., 1990, CIRCUITS INTERCONNEC
[4]  
CAO Y, 2003, P INT ASIC SOC C SEP, P438
[5]  
Cheng C., 2000, INTERCONNECT ANAL SY
[6]   Compact distributed RLC interconnect models - Part I: Single line transient, time delay, and overshoot expressions [J].
Davis, JA ;
Meindl, JD .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2000, 47 (11) :2068-2077
[7]  
Ismail Y. I., 1999, Proceedings 1999 Design Automation Conference (Cat. No. 99CH36361), P721, DOI 10.1109/DAC.1999.782051
[8]  
JOHNSON WC, 1988, TRANSMISSION LINES N
[9]  
Kim SY, 2003, 4TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, PROCEEDINGS, P401
[10]  
Krauter B, 1998, 1998 DESIGN AUTOMATION CONFERENCE, PROCEEDINGS, P303, DOI 10.1109/DAC.1998.724487