Improving the atomic-resolution AFM imaging of monolayer MoS2 for worn tips: a molecular dynamics study

被引:1
作者
Li, Minglin [1 ,2 ,4 ]
Zhuo, Weirong [1 ]
Pang, Haosheng [1 ]
Lai, Lianfeng [3 ,4 ]
机构
[1] Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350116, Fujian, Peoples R China
[2] Fujian Key Lab Med Instrumentat & Pharmaceut Tech, Fuzhou 350108, Fujian, Peoples R China
[3] Ningde Normal Univ, Coll Informat & Mech & Elect Engn, Ningde 352100, Peoples R China
[4] Fuzhou Univ, Inst Tribol, Fuzhou 350116, Fujian, Peoples R China
基金
中国国家自然科学基金;
关键词
FORCE MICROSCOPY; ORGANIC FRAMEWORKS; SIMULATIONS; GRAPHENE; FRICTION; CONTACT; MODEL; APEX;
D O I
10.7567/1347-4065/ab0646
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this paper, molecular dynamics simulations were performed to investigate the atomic-scale imaging of a typical two-dimensional monolayer: molybdenum disulfide (MoS2). With a constant height mode, force-displacement curves of tips along a straight-line scanning path indicate resonant waveforms and the periodicities are capable of characterizing lattice parameters of monolayer MoS2. Some characteristic sites in the forcedisplacement curves arise only for tips with a radius of less than 3 A under 1.47 A tip-sample distance, which correlated to the atoms next to the scanning path. Such characteristic sites can be reproduced by using tips with a radius of 7 A via increasing the tip-sample distance. The underlying mechanism was illustrated by the number of interactive atoms between the tip and the sample. The work may shed light on the atomic force microscope (AFM) operation when one expects to achieve high-resolution AFM imaging of 2D materials with a worn AFM tip. (c) 2019 The Japan Society of Applied Physics
引用
收藏
页数:8
相关论文
共 56 条
  • [1] Aiello CD, 2017, NAT PHYS, V13, P206, DOI 10.1038/nphys3974
  • [2] IMPROVED ATOMIC FORCE MICROSCOPE IMAGES USING MICROCANTILEVERS WITH SHARP TIPS
    AKAMINE, S
    BARRETT, RC
    QUATE, CF
    [J]. APPLIED PHYSICS LETTERS, 1990, 57 (03) : 316 - 318
  • [3] Growth of single gold nanofilaments at the apex of conductive atomic force microscope tips
    Bakhti, S.
    Destouches, N.
    Hubert, C.
    Reynaud, S.
    Vocanson, F.
    Ondarcuhu, T.
    Epicier, T.
    [J]. NANOSCALE, 2016, 8 (14) : 7496 - 7500
  • [4] Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110) surface
    Bamidele, J.
    Kinoshita, Y.
    Turansky, R.
    Lee, S. H.
    Naitoh, Y.
    Li, Y. J.
    Sugawara, Y.
    Stich, I.
    Kantorovich, L.
    [J]. PHYSICAL REVIEW B, 2012, 86 (15):
  • [5] Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
    Baykara, Mehmet Z.
    Dagdeviren, Omur E.
    Schwendemann, Todd C.
    Moenig, Harry
    Altman, Eric I.
    Schwarz, Udo D.
    [J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2012, 3 : 637 - 650
  • [6] ATOMIC FORCE MICROSCOPE
    BINNIG, G
    QUATE, CF
    GERBER, C
    [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
  • [7] 'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study
    Campbellova, Anna
    Ondracek, Martin
    Pou, Pablo
    Perez, Ruben
    Klapetek, Petr
    Jelinek, Pavel
    [J]. NANOTECHNOLOGY, 2011, 22 (29)
  • [8] Cleef M. V., 2010, J MICROSC-OXFORD, V181, P2
  • [9] Single-layer MoS2 nanopores as nanopower generators
    Feng, Jiandong
    Graf, Michael
    Liu, Ke
    Ovchinnikov, Dmitry
    Dumcenco, Dumitru
    Heiranian, Mohammad
    Nandigana, Vishal
    Aluru, Narayana R.
    Kis, Andras
    Radenovic, Aleksandra
    [J]. NATURE, 2016, 536 (7615) : 197 - +
  • [10] Wear-Resistant Diamond Nanoprobe Tips with Integrated Silicon Heater for Tip-Based Nanomanufacturing
    Fletcher, Patrick C.
    Felts, Jonathan R.
    Dai, Zhenting
    Jacobs, Tevis D.
    Zeng, Hongjun
    Lee, Woo
    Sheehan, Paul E.
    Carlisle, John A.
    Carpick, Robert W.
    King, William P.
    [J]. ACS NANO, 2010, 4 (06) : 3338 - 3344