An Improved Dual-probe Approach to Measure Noise Source Impedance

被引：1

作者：

Bo, Zhao ^{[1
]}

Min, Zhao ^{[1
]}

Feng Zhiming ^{[2
]}

Shui Limin ^{[2
]}

Min, Yao ^{[1
]}

机构：

[1] Nanjing Univ Aeronaut & Astronaut, Coll Automat Engn, 29 Yudao St, Nanjing, Jiangsu, Peoples R China

[2] Jiangsu Inst Metrol, EMC Lab, Nanjing, Jiangsu, Peoples R China

来源：

2010 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY & TECHNICAL EXHIBITION ON EMC RF/MICROWAVE MEASUREMENTS & INSTRUMENTATION | 2010年

关键词：

Noise Source Impedance; Dual-probe Approach; Electromagnetic Interference (EMI);

D O I：

10.1109/APEMC.2010.5475573

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper an improved dual-probe approach is proposed to measure the source impedance of conducted EMI noise. Two-impedance method, which can reduce the influence of testing cable loss caused by high frequency, instead of shortcircuit method is used to minimize the measurement errors of conducted EMI noise source impedance. A switched-mode power supply (SMPS) is taken to measure its conducted EMI noise source impedance. Experimental results show that this method is feasible and can improve testing inaccuracy of conducted EMI noise source impedance.

引用

页码：214 / 217

页数：4

共 7 条

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