Modeling of life deterioration by ion bombardment of a dispenser cathode coated with an Ir/W film

被引:6
作者
Higuchi, T
Yamamoto, S
Kudo, H
Murata, H
机构
[1] Toshiba Elect Engn Corp, Cathode Ray Tube Design & Engn Dept, Isogo Ku, Yokohama, Kanagawa 2358522, Japan
[2] Univ Tsukuba, Inst Appl Phys, Tsukuba, Ibaraki 3050006, Japan
关键词
dispenser cathodes; impregnated cathodes; ion bombardment; cathode life;
D O I
10.1016/S0169-4332(02)00846-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have developed the calculation method for ion bombardment traces. When an M type dispenser cathode is operated in a cathode ray tube (CRT), the surface coating film is subjected to ion bombardment due to ionized residual gas. With long-time use, the coating film is dissipated and a change to an S type occurs. This occurrence of an S type causes a deterioration of emission and focus characteristics. A method for calculating the life time dependency of the shape of ion bombardment traces using the degree of vacuum in the tube, the grid voltage, and the cathode current was studied. The calculated results and measured results were in close agreement. As a result, it was confirmed that modeling is possible using (1) an electron and ion beam trajectory calculation program, and (2) formulas for calculating the ionization cross-section and sputtering yield. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:125 / 137
页数:13
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