Field emission and electron microscopy

被引：0
作者：
Edgcombe, CJ
Valdrè, U
机构：
[1] Ist Nazl Fis Mat, I-40126 Bologna, Italy
[2] Univ Bologna, Dept Phys, I-40126 Bologna, Italy
[3] Univ Cambridge, Cavendish Lab, Dept Phys, Cambridge CB3 0HE, England
来源：
MICROSCOPY AND MICROANALYSIS | 2000年 / 6卷 / 04期
关键词：
work function; field emission; nano-tips; electron guns; finite element analysis; specimen holders; carbon contamination; transmission electron microscopy; scanning electron microscopy; scanning transmission electron microscopy;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
An overview and new results are presented of the investigations carried out in the last 5 years on nano-sized tips by means of electron microscopy, an electron optical bench, and computation. Tungsten and. in particular, carbon nano-tips prepared by carbon contamination in a scanning electron microscope, were studied for applications as field-emission electron sources. Several features of their use are described and the results concerning the determination of some of their basic properties are reported.
引用
收藏
页码：380 / 387
页数：8
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