Widely tunable low-power high-linearity current-mode integrator built using DG-MOSFETs

被引:0
|
作者
Kaya, Savas [1 ]
Hamed, Hesham F. A. [2 ]
Kulkarni, Anish [1 ]
机构
[1] Ohio Univ, Sch Elect Engn & Comp Sci, Athens, OH 45701 USA
[2] Menia Univ, Dept Elect Engn, El Minia 61111, Egypt
关键词
CMOS analog integrated circuits; Integrators; DG-MOSFET; SOI; HARMONIC DISTORTION;
D O I
10.1007/s10470-009-9334-6
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A novel tunable current-mode integrator for low-voltage low-power applications is presented using mixed-mode TCAD simulations. The design is based on independently driven double-gate (IDDG) MOSFETs, a nano-scale four-terminal device, where one gate can be used to change the characteristics of the other. Using current-mirrors built with IDDG-MOSFETs, we show that the number of active devices in the tunable current-mode integrator, 16 in bulk CMOS design, may be halved, i.e. considerable savings in both total area and power dissipation. The integrator operates with single supply voltage of 1 V and a wide range of tunable bandwidth (similar to 2 decades) and gain (similar to 30 dB). This linear circuit has third-order harmonic distortion as low as -70 dB in appropriate bias conditions, which can be set via the back-gates. The impact of tuning on the IDDG integrator and conventional design using symmetrically driven (SDDG) MOSFETs is comparatively studied. The proposed design is a good example for performance leverage through IDDG MOSFET architectures in analog circuits integral to future mixed-signal systems.
引用
收藏
页码:215 / 222
页数:8
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