Effects of trimethylol propane and AAS salt on properties of waterborne polyurethane with low gloss
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作者:
Cao, Xianli
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South China Univ Technol, Sch Mat Sci & Engn, Guangzhou 510640, Guangdong, Peoples R ChinaSouth China Univ Technol, Sch Mat Sci & Engn, Guangzhou 510640, Guangdong, Peoples R China
Cao, Xianli
[1
]
Ge, Xia
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South China Univ Technol, Sch Mat Sci & Engn, Guangzhou 510640, Guangdong, Peoples R ChinaSouth China Univ Technol, Sch Mat Sci & Engn, Guangzhou 510640, Guangdong, Peoples R China
Ge, Xia
[1
]
Chen, Huanhuan
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South China Univ Technol, Sch Mat Sci & Engn, Guangzhou 510640, Guangdong, Peoples R ChinaSouth China Univ Technol, Sch Mat Sci & Engn, Guangzhou 510640, Guangdong, Peoples R China
Chen, Huanhuan
[1
]
Li, Wenbo
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South China Univ Technol, Sch Mat Sci & Engn, Guangzhou 510640, Guangdong, Peoples R ChinaSouth China Univ Technol, Sch Mat Sci & Engn, Guangzhou 510640, Guangdong, Peoples R China
Li, Wenbo
[1
]
机构:
[1] South China Univ Technol, Sch Mat Sci & Engn, Guangzhou 510640, Guangdong, Peoples R China
A series of waterborne polyurethane(WPU) dispersions containing different amounts of trimethylol propane(TMP) and/or 2-[(2-aminoethyl)amino]ethanesulfonic acid sodium salt (AAS salt), were synthesized by prepolymer emulsification process. The effects of TMP and AAS salt on properties of WPU dispersions were discussed to find out the appropriate formulation of WPU dispersion with low gloss. The results showed the particle size of WPU increased as the TMP content increased, but a decrease to the gloss and transparency. Spherical granules emerged in the surface morphology of WPU films when the TMP content exceeded beyond 1% by weight via scanning electron microscope (SEM). In contrast, as the AAS salt content increased, the particle size of WPU decreased, and the gloss and transparency increased. It was most worth noting that the dispersion stability of WPU dispersions was enhanced dramatically with the increase of AAS salt content by measuring the Zeta potential of emulsion. Therefore, WPU dispersions with low gloss and high dispersion stability can be prepared successfully with the AAS content of 0.5% by weight and the TMP content of 1%-1.5% by weight when other influence factors were fixed to a suitable condition. (C) 2017 Elsevier B.V. All rights reserved.
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Naval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USANaval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USA
Giles, Spencer L.
Heller, Nicholas W. M.
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SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USANaval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USA
Heller, Nicholas W. M.
Clayton, Clive R.
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SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USANaval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USA
Clayton, Clive R.
Walker, Mark E.
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Sherwin Williams Co, 101 West Prospect Ave, Cleveland, OH 44115 USANaval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USA
Walker, Mark E.
Wytiaz, Mark J.
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Sherwin Williams Co, 101 West Prospect Ave, Cleveland, OH 44115 USANaval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USA
Wytiaz, Mark J.
Wynne, James H.
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Naval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USANaval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USA
机构:
Naval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USANaval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USA
Giles, Spencer L.
Heller, Nicholas W. M.
论文数: 0引用数: 0
h-index: 0
机构:
SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USANaval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USA
Heller, Nicholas W. M.
Clayton, Clive R.
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h-index: 0
机构:
SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USANaval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USA
Clayton, Clive R.
Walker, Mark E.
论文数: 0引用数: 0
h-index: 0
机构:
Sherwin Williams Co, 101 West Prospect Ave, Cleveland, OH 44115 USANaval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USA
Walker, Mark E.
Wytiaz, Mark J.
论文数: 0引用数: 0
h-index: 0
机构:
Sherwin Williams Co, 101 West Prospect Ave, Cleveland, OH 44115 USANaval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USA
Wytiaz, Mark J.
Wynne, James H.
论文数: 0引用数: 0
h-index: 0
机构:
Naval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USANaval Res Lab, Div Chem, Code 6124,4555 Overlook Ave Southwest, Washington, DC 20375 USA