Scanning Hall Probe Imaging of Nanoscale Magnetic Structures

被引：2

作者：

Bending, S. J. ^{[1
]}

Khotkevych, V. V. ^{[1
]}

机构：

[1] Univ Bath, Dept Phys, Bath BA2 7AY, Avon, England

来源：

SENSOR LETTERS | 2009年 / 7卷 / 03期

基金：

英国工程与自然科学研究理事会;

关键词：

Magnetic Microscopy; Hall Effect; Magnetometry; MICROSCOPY; SENSORS; SUPERCONDUCTORS; THIN;

D O I：

10.1166/sl.2009.1099

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Scanning Hall probe microscopy (SHPM) is a novel magnetic imaging technique based on Hall-effect nanosensors with important applications in the quantitative mapping of nanoscale superconducting and ferromagnetic materials. It is highly complementary to other imaging approaches, e.g., Magnetic Force Microscopy (MFM). SHPM is almost completely non-invasive, can be used over a wide range of temperatures (0.3-300 K) and magnetic fields (0-7 T) and is particularly valuable when quantitative maps of magnetic induction are required with very high signal:noise ratios. Recent developments in sensor technology will be described and illustrated by relevant imaging case studies. In addition applications of nanoscale Hall sensors in micro-magnetometry will be reviewed.

引用

页码：503 / 506

页数：4

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