An Evaluation of An Ultralow Background Alpha-Particle Detector

被引：20

作者：

Gordon, Michael S. ^{[1
]}

Heidel, David F. ^{[1
]}

Rodbell, Kenneth P. ^{[1
]}

Dwyer-McNally, Brendan ^{[2
]}

Warburton, William K. ^{[2
]}

机构：

[1] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

[2] XIA LLC, Hayward, CA 94544 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2009年 / 56卷 / 06期

关键词：

Alpha-particle detector; electronic signal rejection; ionization counter; low background;

D O I：

10.1109/TNS.2009.2034001

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

XIA has provided IBM with a prototype ultralow background alpha particle counter for evaluation. Results show a significant decrease in background compared to other commercial counters allowing for rapid measurement of low-emissivity materials.

引用

页码：3381 / 3386

页数：6

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