Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements (vol 37, 031401, 2019)

被引：6

作者：

Baer, Donald R. ^{[1
]}

Artyushkova, Kateryna ^{[2
]}

Brundle, Christopher Richard ^{[3
]}

Castle, James E. ^{[4
]}

Engelhard, Mark H. ^{[1
]}

Gaskell, Karen J. ^{[5
]}

Grant, John T. ^{[6
]}

Haasch, Richard T. ^{[7
]}

Linford, Matthew R. ^{[8
]}

Powell, Cedric J. ^{[9
]}

Shard, Alexander G. ^{[10
]}

Sherwood, Peter M. A. ^{[11
]}

Smentkowski, Vincent S. ^{[12
]}

机构：

[1] Pacific Northwest Natl Lab, Environm Mol Sci Lab, POB 999, Richland, WA 99352 USA

[2] Physical Elect Inc, Chanhassen, MN 55317 USA

[3] CR Brundle & Associates, 4215 Fairway Dr, Soquel, CA 95073 USA

[4] Univ Surrey, Dept Mech Engn Sci, Guildford GU2 7XH, Surrey, England

[5] Univ Maryland, Dept Chem & Biochem, College Pk, MD 20720 USA

[6] Surface Anal Consulting, Clearwater, FL 33767 USA

[7] Univ Illinois, Mat Res Lab, 104 S Goodwin Ave, Urbana, IL 61801 USA

[8] Brigham Young Univ, Dept Chem & Biochem, Provo, UT 84602 USA

[9] Natl Inst Stand & Technol, 100 Bur Dr, Gaithersburg, MD 20899 USA

[10] Natl Phys Lab, Teddington TW11 0LW, Middx, England

[11] Univ Washington, Dept Chem, Seattle, WA 98950 USA

[12] General Elect GRC, 1 Res Circle,Bldg K1 1D41, Niskayuna, NY 12309 USA

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2021年 / 39卷 / 01期

关键词：

D O I：

10.1116/6.0000822

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页数：2

共 4 条

[1] Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements [J].

Baer, Donald R. ;

Artyushkova, Kateryna ;

Brundle, Christopher Richard ;

Castle, James E. ;

Engelhard, Mark H. ;

Gaskell, Karen J. ;

Grant, John T. ;

Haasch, Richard T. ;

Linford, Matthew R. ;

Powell, Cedric J. ;

Shard, Alexander G. ;

Sherwood, Peter M. A. ;

Smentkowski, Vincent S. .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2019, 37 (03)

[2] Practical guide for curve fitting in x-ray photoelectron spectroscopy [J].

Major, George H. ;

Farley, Neal ;

Sherwood, Peter M. A. ;

Linford, Matthew R. ;

Terry, Jeff ;

Fernandez, Vincent ;

Artyushkova, Kateryna .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2020, 38 (06)

[3] The use and misuse of curve fitting in the analysis of core X-ray photoelectron spectroscopic data [J].

Sherwood, Peter M. A. .

SURFACE AND INTERFACE ANALYSIS, 2019, 51 (06) :589-610

[4] Rapid evaluation of the Voigt function and its use for interpreting X-ray photoelectron spectroscopic data [J].

Sherwood, Peter M. A. .

SURFACE AND INTERFACE ANALYSIS, 2019, 51 (02) :254-274

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