Interface and surface effects on the glass transition in thin polystyrene films

被引：523

作者：

DeMaggio, GB ^{[1
]}

Frieze, WE ^{[1
]}

Gidley, DW ^{[1
]}

Zhu, M ^{[1
]}

Hristov, HA ^{[1
]}

Yee, AF ^{[1
]}

机构：

[1] UNIV MICHIGAN,DEPT MAT SCI & ENGN,ANN ARBOR,MI 48109

来源：

PHYSICAL REVIEW LETTERS | 1997年 / 78卷 / 08期

关键词：

D O I：

10.1103/PhysRevLett.78.1524

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Lifetime analysis of positronium annihilating in nanometer voids is used to study the thermal expansion behavior of thin, Si-supported polystyrene films near the glass transition temperature T-g. A reduction in void volume expansion is correlated with a reduction in the apparent T-g as film thickness decreases. Our results can be fitted using a three-layer model incorporating a 50 Angstrom constrained layer at the Si interface and a 20 Angstrom surface region with reduced T-g.

引用

页码：1524 / 1527

页数：4

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[2]

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