Effects of Photovoltaic Module Soiling on Glass Surface Resistance and Potential-Induced Degradation

被引:0
作者
Hacke, Peter [1 ]
Burton, Patrick [2 ]
Hendrickson, Alex [2 ]
Spataru, Sergiu [3 ]
Glick, Stephen [1 ]
Terwilliger, Kent [1 ]
机构
[1] Natl Renewable Energy Lab, Golden, CO USA
[2] Sandia Natl Labs, Albuquerque, NM USA
[3] Aalborg Univ, Aalborg, Denmark
来源
2015 IEEE 42ND PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC) | 2015年
关键词
dust; photovoltaic modules; potential-induced degradation; sea salt; soiling; soot; surface resistance;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
The sheet resistance of three soil types (Arizona road dust, soot, and sea salt) on glass were measured by the transmission line method as a function of relative humidity (RH) between 39% and 95% at 60 degrees C. Sea salt yielded a 3.5 orders of magnitude decrease in resistance on the glass surface when the RH was increased over this RH range. Arizona road dust showed reduced sheet resistance at lower RH, but with less humidity sensitivity over the range tested. The soot sample did not show significant resistivity change compared to the unsoiled control. Photovoltaic modules with sea salt on their faces were step-stressed between 25% and 95% RH at 60 degrees C applying -1000 V bias to the active cell circuit. Leakage current from the cell circuit to ground ranged between two and ten times higher than that of the unsoiled controls. Degradation rate of modules with salt on the surface increased with increasing RH and time.
引用
收藏
页数:4
相关论文
共 50 条
  • [41] Potential-induced degradation in bifacial silicon heterojunction solar modules: Insights and mitigation strategies
    Arriaga Arruti, Olatz
    Gnocchi, Luca
    Jeangros, Quentin
    Ballif, Christophe
    Virtuani, Alessandro
    PROGRESS IN PHOTOVOLTAICS, 2024, 32 (05): : 304 - 316
  • [42] Reduction in the short-circuit current density of silicon heterojunction photovoltaic modules subjected to potential-induced degradation tests
    Yamaguchi, Seira
    Yamamoto, Chizuko
    Ohdaira, Keisuke
    Masuda, Atsushi
    SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2017, 161 : 439 - 443
  • [43] Delay of the potential-induced degradation of n-type crystalline silicon photovoltaic modules by the prior application of reverse bias
    Wu, Deqin
    Tu, Huynh Thi Cam
    Ohdaira, Keisuke
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2024, 63 (02)
  • [44] Potential-Induced Degradation of Bifacial PERC Solar Cells Under Illumination
    Sporleder, Kai
    Bauer, Jan
    Grosser, Stephan
    Richter, Susanne
    Haehnel, Angelika
    Turek, Marko
    Naumann, Volker
    Ilse, Klemens Konstantin
    Hagendorf, Christian
    IEEE JOURNAL OF PHOTOVOLTAICS, 2019, 9 (06): : 1522 - 1525
  • [45] Investigation of polysilicon passivated contact's resilience to potential-induced degradation
    Luo, Wei
    Chen, Ning
    Ke, Cangming
    Wang, Yan
    Aberle, Armin G.
    Ramakrishna, Seeram
    Duttagupta, Shubham
    Khoo, Yong Sheng
    SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2019, 195 : 168 - 173
  • [46] Investigation of Potential-Induced Degradation in Bifacial n-PERL Modules
    Luo, Wei
    Chen, Ning
    Shanmugam, Vinodh
    Yan, Xia
    Duttagupta, Shubham
    Wang, Yan
    Aberle, Armin G.
    Khoo, Yong Sheng
    IEEE JOURNAL OF PHOTOVOLTAICS, 2020, 10 (04): : 935 - 939
  • [47] Transient carrier recombination dynamics in potential-induced degradation p-type single-crystalline Si photovoltaic modules
    Islam, Mohammad Aminul
    Matsuzaki, Hiroyuki
    Okabayashi, Yuusuke
    Ishikawa, Yasuaki
    PROGRESS IN PHOTOVOLTAICS, 2019, 27 (08): : 682 - 692
  • [48] Initial detection of potential-induced degradation using dark I-V characteristics of crystalline silicon photovoltaic modules in the outdoors
    Oh, Wonwook
    Bae, Soohyun
    Kim, Donghwan
    Park, Nochang
    MICROELECTRONICS RELIABILITY, 2018, 88-90 : 998 - 1002
  • [49] Potential-Induced Degradation Behavior of n-Type Single-Crystalline Silicon Photovoltaic Modules with a Rear-Side Emitter
    Yamaguchi, Seira
    Masuda, Atsushi
    Ohdaira, Keisuke
    2016 IEEE 43RD PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), 2016, : 938 - 942
  • [50] Prediction of Potential-Induced Degradation Rate of Thin-Film Modules in the Field Based on Coulombs Transferred
    Hacke, Peter
    Johnston, Steve
    Luo, Wei
    Spataru, Sergiu
    Smith, Ryan
    Repins, Ingrid
    2018 IEEE 7TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION (WCPEC) (A JOINT CONFERENCE OF 45TH IEEE PVSC, 28TH PVSEC & 34TH EU PVSEC), 2018, : 3801 - 3806