Simple and fast microwave-enhanced wet etching of SiC particles for electroless Ni-P plating

被引:35
作者
Kang, M
Kim, JM
Kim, JW
Kim, YK
Chung, H
Yie, JE [1 ]
机构
[1] Ajou Univ, Dept Appl Chem, Catalyst & Surface Lab, Suwon 442749, South Korea
[2] Ajou Univ, Dept Mol Sci & Technol & Appl Chem, Funct Mat Lab, Suwon 442749, South Korea
[3] Osan Coll, Dept Shoemaking Ind, Osan 447749, South Korea
[4] Ajou Univ, Powder Mat Lab, Dept Mol Sci & Technol & Mat Sci Engn, Suwon 442749, South Korea
关键词
microwave-enhanced etching; SiC particle; electroless metal plating; Ni-P; surface modification;
D O I
10.1016/S0257-8972(02)00326-2
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A simple and fast microwave-enhanced wet chemical etching process of SiC particles has been developed for electroless Ni-P plating, and the etching effects are investigated by using BET surface area analysis, SEM, XPS and XAFS. The results indicate that the microwave etching for only 30 s gives the formation of surface oxide species, which leads to an increase in BET surface area of the SiC sample. The modified SiC surfaces are suitable for the electroless Ni-P plating and the deposit exhibits excellent chemical and mechanical adhesion strength. The etching technique, developed in the present work, will be a very useful tool for the preparation of composite materials between SiC particles and metal matrix. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:79 / 85
页数:7
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