Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions

被引：18

作者：

Vlagkoulis, Vasileios ^{[1
]}

Sari, Aitzan ^{[1
]}

Vrachnis, John ^{[1
]}

Antonopoulos, Georgios ^{[1
]}

Segkos, Nikolaos ^{[1
]}

Psarakis, Mihalis ^{[1
]}

Tavoularis, Antonios ^{[2
]}

Furano, Gianluca ^{[2
]}

Boatella Polo, Cesar ^{[2
]}

Poivey, Christian ^{[2
]}

Ferlet-Cavrois, Veronique ^{[2
]}

Kastriotou, Maria ^{[3
]}

Fernandez Martinez, Pablo ^{[3
]}

Alia, Ruben Garcia ^{[3
]}

Voss, Kay-Obbe ^{[4
]}

Schuy, Christoph ^{[4
]}

机构：

[1] Univ Piraeus, Dept Informat, Piraeus 18534, Greece

[2] Estec, European Space Agcy ESA, NL-2201 Noordwijk, Netherlands

[3] CERN, CH-1211 Geneva, Switzerland

[4] GSI Helmholtz Ctr, D-64291 Darmstadt, Germany

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2021年 / 68卷 / 01期

关键词：

Field programmable gate arrays; Ions; Radiation effects; Random access memory; Neutrons; Ion beams; Aerospace electronics; Field programmable gate array (FPGA); heavy ion irradiation; single-event effects (SEEs); Zynq-7000; family;

D O I：

10.1109/TNS.2020.3033188

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 field programmable gate array (FPGA) and presents an in-depth analysis of the SEE susceptibility of all the memories of the programmable logic. The radiation experiments were performed in the CERN North Area facility and in the GSI Helmholtz Centre for Heavy Ion Research using very/ultra high-energy heavy ions. The offline analysis of the radiation experimental results produced a deep understanding for various SEE phenomena observed in the Zynq-7000 FPGAs, such as single-event function interrupts (SEFIs), single-event transient (SET) in global signals, and multiple bit upsets that could be key issues for the design of an effective SEE mitigation approach.

引用

页码：36 / 45

页数：10