Spatially Resolved Measurements of Thermal Stresses by Picosecond Time-Domain Probe Beam Deflection

被引：3

作者：

Cahill, David G. ^{[1
,2
]}

Zheng, Xuan ^{[1
,2
]}

Zhao, Ji-Cheng ^{[3
]}

机构：

[1] Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USA

[2] Univ Illinois, Mat Res Lab, Urbana, IL 61801 USA

[3] Ohio State Univ, Dept Mat Sci & Engn, Columbus, OH 43210 USA

来源：

JOURNAL OF THERMAL STRESSES | 2010年 / 33卷 / 01期

基金：

美国国家科学基金会;

关键词：

Coefficient of thermal expansion; Combinatorial materials science; Pump-probe techniques; Ultrafast laser metrology; COMBINATORIAL;

D O I：

10.1080/01495730903408690

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

Measurements of thermally induced strains with micron-scale lateral spatial resolution, picosecond time resolution, and sub-picometer vertical sensitivity are achieved using a newly developed experimental method, time-domain probe beam defection (TD-PBD). TD-PBD is a pump-probe optical technique that combines an ultrafast laser oscillator as the light source, high frequency (10MHz) modulation of the pump beam, and a wide range of time delays (0-4ns) between the pump and probe. Deflections of the probe beam are measured by a position sensitive detector and an rf lockin amplifier. The beam-deflection data are analyzed using a detailed model of heat transport and thermally generated stresses and strains. Comparisons between the model and the data enable quantitative measurements of the coefficient of thermal expansion with a spatial resolution of 4 mu m.

引用

页码：9 / 14

页数：6

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