Use of interference colours to distinguish between fast and slow axes of a quarter wave plate

被引:6
作者
Shah, Archana [1 ]
Ghalsasi, Pallavi [1 ]
机构
[1] Navrachana Univ, Sch Engn & Technol, Vasna Bhayli Rd, Vadodara 391410, Gujarat, India
关键词
quarter waveplate; birefringence; fast axis; slow axis; interference colours; Michel Levy chart; FAST AXIS;
D O I
10.1088/1361-6404/ab2fef
中图分类号
G40 [教育学];
学科分类号
040101 ; 120403 ;
摘要
A quarter wave plate is commonly used to generate circularly and elliptically polarized light owing to its birefringent property. The orientation of its fast and slow axes with respect to linearly polarized light decides the resultant polarization. Often, low-priced wave plates do not come with their fast and slow axes marked. Users are supposed to conduct a test based on colour changes as seen while tilting the quarter wave plate and assigning the respective axes. Although this procedure is routinely advised, the physics behind the typically observed colours is seldom discussed in the literature. The present article is structured as a tutorial to understand the origin of observed interference colours while a quarter wave plate is tilted about its fast or slow axes. The explanation is given on the basis of the Michel Levy interference colour chart. At the same time, the tutorial is intended to introduce new researchers from multidisciplinary fields like physics, geology, mineralogy and chemistry to basics pertaining to birefringence in a comprehensive way as they are not taught in disciplinary college/university curricula otherwise.
引用
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页数:19
相关论文
共 19 条
[1]   Method for determining the fast axis and phase retardation of a wave plate [J].
Chiu, MH ;
Chen, CD ;
Su, DC .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1996, 13 (09) :1924-1929
[2]   Muscovite mica: Flatter than a pancake [J].
de Poel, Wester ;
Pintea, Stelian ;
Drnec, Jakub ;
Carla, Francesco ;
Felici, Roberto ;
Mulder, Peter ;
Elemans, Johannes A. A. W. ;
van Enckevort, Willem J. P. ;
Rowan, Alan E. ;
Vlieg, Elias .
SURFACE SCIENCE, 2014, 619 :19-24
[3]  
Delly J. G., 2008, ESSENTIALS POLARIZED, V5th
[4]   Birefringence of muscovite mica [J].
El-Bahrawi, MS ;
Nagib, NN ;
Khodier, SA ;
Sidki, HM .
OPTICS AND LASER TECHNOLOGY, 1998, 30 (6-7) :411-415
[5]  
Galgano G D, 2005, DETERMINING FAST AXI
[6]  
Gribble C D, 1993, OPTICAL MINERALOGY
[7]   A simple method to measure the thickness and order number of a wave plate [J].
Hu, Yichuan ;
Yi, Zhenglei ;
Yang, Hujiang ;
Xiao, Jinghua .
EUROPEAN JOURNAL OF PHYSICS, 2013, 34 (05) :1167-1173
[8]  
Kerr P.F., 1977, OPTICAL MINERALOGY, V4rt
[9]   DETERMINATION OF THE FAST AXIS WITH AN INFRARED SPECTROMETER FOR QUARTZ AND MICA WAVEPLATES [J].
LI, GH ;
LI, JH ;
LI, Y .
APPLIED OPTICS, 1990, 29 (13) :1870-1871
[10]   Simple method for determining the fast axis of a wave plate [J].
Logofatu, PC .
OPTICAL ENGINEERING, 2002, 41 (12) :3316-3318