Analysis of small-angle X-ray scattering data in the presence of significant instrumental smearing

被引：7

作者：

Bergenholtz, Johan ^{[1
,2
]}

Ulama, Jeanette ^{[1
]}

Oskolkova, Malin Zackrisson ^{[2
]}

机构：

[1] Univ Gothenburg, Dept Chem & Mol Biol, SE-41296 Gothenburg, Sweden

[2] Lund Univ, Ctr Chem & Chem Engn, Div Phys Chem, SE-22100 Lund, Sweden

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2016年 / 49卷

基金：

瑞典研究理事会;

关键词：

small-angle X-ray scattering; pinhole collimation; instrumental smearing effects; NEUTRON-SCATTERING; RESOLUTION FUNCTION; FLUX; COLLIMATION; SYSTEM; SAXS;

D O I：

10.1107/S1600576715023444

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A laboratory-scale small-angle X-ray scattering instrument with pinhole collimation has been used to assess smearing effects due to instrumental resolution. A new, numerically efficient method to smear ideal model intensities is developed and presented. It allows for directly using measured profiles of isotropic but otherwise arbitrary beams in smearing calculations. Samples of low-polydispersity polymer spheres have been used to show that scattering data can in this way be quantitatively modeled even when there is substantial distortion due to instrumental resolution.

引用

页码：47 / 54

页数：8

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