Nanomechanical testing at high strain rates: New instrumentation for nanoindentation and microcompression

被引：76

作者：

Guillonneau, Gaylord ^{[1
,2
]}

Mieszala, Maxime ^{[1
]}

Wehrs, Juri ^{[1
]}

Schwiedrzik, Jakob ^{[1
]}

Grop, Serge ^{[1
,4
]}

Frey, Damian ^{[1
]}

Philippe, Laetitia ^{[1
]}

Breguet, Jean-Marc ^{[4
]}

Michler, Johann ^{[1
]}

Wheeler, Jeffrey M. ^{[3
]}

机构：

[1] Swiss Fed Labs Mat Sci & Technol, Empa, Lab Mech Mat & Nanostruct, Feuerwerkerstr 39, CH-3602 Thun, Switzerland

[2] Univ Lyon, Lab Tribol & Dynam Syst, CNRS, ECL,UMR 5513,ENISE,ENTPE, 36 Ave Guy Collongue, F-69134 Ecully, France

[3] Swiss Fed Inst Technol, Dept Mat Sci, Lab Nanometallurgy, Vladimir Prelog Weg 5, CH-8093 Zurich, Switzerland

[4] Alemnis AG, Feuerwerkerstr 39, CH-3602 Thun, Switzerland

来源：

MATERIALS & DESIGN | 2018年 / 148卷

关键词：

High strain rate; Nanoindentation; Microcompression; Nanocrystalline nickel; CONTINUOUS STIFFNESS MEASUREMENT; SITU MICRO-COMPRESSION; RATE SENSITIVITY; INDENTATION EXPERIMENTS; MECHANICAL-PROPERTIES; SENSING INDENTATION; PLASTIC-DEFORMATION; NANOCRYSTALLINE NI; ENERGY-DISSIPATION; ELASTIC-MODULUS;

D O I：

10.1016/j.matdes.2018.03.050

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Micromechanical testing is normally limited to the quasi-static strain rate regime: 10(-5) to 10(-2) s(-1). In thiswork, a nanomechanical testing device has been developed that allows indentation and microcompression at strain rates from the quasi-static regime continuously up to the high strain rate regime. To reach the highest strain rates, the conventional, strain gage-based load cell was replaced with a new piezo-based sensor. The sensor's concept, calibration methods, and measurement strategies are detailed. It is shown, using nanocrystalline Nickel as a case study material, that this new high strain rate device can measure precisely mechanical properties at strain rates up to 1000 s(-1) by nanoindentation, and strain rates up to 100 s(-1) by microcompression, enabling the device to measure strain rates over 9 orders of magnitude. (C) 2018 Elsevier Ltd. All rights reserved.

引用

页码：39 / 48

页数：10

共 55 条

[1]

[Anonymous], 2010, INTRO PRACTICE MOL S

[2] Nanoindentation and contact stiffness measurement using force modulation with a capacitive load-displacement transducer [J].

Asif, SAS ;

Wahl, KJ ;

Colton, RJ .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (05) :2408-2413

[3] The hardness and strength of metal tribofilms: An apparent contradiction between nanoindentation and pillar compression [J].

Battaile, Corbett C. ;

Boyce, Brad L. ;

Weinberger, Christopher R. ;

Prasad, Somuri V. ;

Michael, Joseph R. ;

Clark, Blythe G. .

ACTA MATERIALIA, 2012, 60 (04) :1712-1720

[4] Quantitative Impact Testing of Energy Dissipation at Surfaces [J].

Constantinides, G. ;

Tweedie, C. A. ;

Savva, N. ;

Smith, J. F. ;

Van Vliet, K. J. .

EXPERIMENTAL MECHANICS, 2009, 49 (04) :511-522

[5] Quantifying deformation and energy dissipation of polymeric surfaces under localized impact [J].

Constantinides, Georgios ;

Tweedie, Catherine A. ;

Holbrook, Doria M. ;

Barragan, Patrick ;

Smith, James F. ;

Van Vlietl, Krystyn J. .

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2008, 489 (1-2) :403-412

[6] Nanocrystalline electrodeposited Ni: microstructure and tensile properties [J].

Dalla Torre, F ;

Van Swygenhoven, H ;

Victoria, M .

ACTA MATERIALIA, 2002, 50 (15) :3957-3970

[7] Advances in Transmission Electron Microscopy: In Situ Straining and In Situ Compression Experiments on Metallic Glasses [J].

De Hosson, Jeff Th. M. .

MICROSCOPY RESEARCH AND TECHNIQUE, 2009, 72 (03) :250-260

[8] Nacre-nanomimetics: Strong, Stiff, and Plastic [J].

De Luca, Francois ;

Menzel, Robert ;

Blaker, Jonny J. ;

Birkbeck, John ;

Bismarck, Alexander ;

Shaffer, Milo S. P. .

ACS APPLIED MATERIALS & INTERFACES, 2015, 7 (48) :26783-26791

[9] Can micro-compression testing provide stress-strain data for thin films? A comparative study using Cu, VN, TiN and W coatings [J].

Dehm, G. ;

Woergoetter, H. P. ;

Cazottes, S. ;

Purswani, J. M. ;

Gall, D. ;

Mitterer, C. ;

Kiener, D. .

THIN SOLID FILMS, 2009, 518 (05) :1517-1521

[10] Development and application of a heated in-situ SEM micro-testing device [J].

Fritz, R. ;

Kiener, D. .

MEASUREMENT, 2017, 110 :356-366

← 1 2 3 4 5 6 →