The characteristics of electrical trees in the inner and outer layers of different voltage rating XLPE cable insulation

被引:19
作者
Xie, Ansheng [1 ,2 ]
Li, Shengtao [1 ]
Zheng, Xiaoquan [1 ]
Chen, George [3 ]
机构
[1] Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China
[2] Changan Univ, Sch Environm Sci & Engn, Xian 710054, Peoples R China
[3] Univ Southampton, Sch Elect & Comp Sci, Southampton SO17 1BJ, Hants, England
基金
中国国家自然科学基金;
关键词
PARTIAL DISCHARGES; MECHANICAL-STRESS; BREAKDOWN; GROWTH; MODEL; POLYETHYLENE; PROPAGATION; SIMULATION;
D O I
10.1088/0022-3727/42/12/125106
中图分类号
O59 [应用物理学];
学科分类号
摘要
The statistical initiation and propagation characteristics of electrical trees in cross-linked polyethylene (XLPE) cables with different voltage ratings from 66 to 500 kV were investigated under a constant test voltage of 50 Hz/7 kV (the 66 kV rating cable is from UK, the others from China). It was found that the characteristics of electrical trees in the inner region of 66 kV cable insulation differed considerably from those in the outer region under the same test conditions; however, no significant differences appeared in the 110 kV rating cable and above. The initiation time of electrical trees in both the inner and the outer regions of the 66 kV cable is much shorter than that in higher voltage rating cables; in addition the growth rate of electrical trees in the 66 kV cable is much larger than that in the higher voltage rating cables. By using x-ray diffraction, differential scanning calorimetry and thermogravimetry methods, it was revealed that besides the extrusion process, the molecular weight of base polymer material and its distribution are the prime factors deciding the crystallization state. The crystallization state and the impurity content are responsible for the resistance to electrical trees. Furthermore, it was proposed that big spherulites will cooperate with high impurity content in enhancing the initiation and growth processes of electrical trees via the 'synergetic effect'. Finally, dense and small spherulites, high crystallinity, high purity level of base polymer material and super-clean production processes are desirable for higher voltage rating cables.
引用
收藏
页数:10
相关论文
共 25 条
[1]   LUMINESCENCE IN CROSS-LINKED POLYETHYLENE AT ELEVATED-TEMPERATURES [J].
BAMJI, SS ;
BULINSKI, AT ;
SUZUKI, H ;
MATSUKI, M ;
IWATA, Z .
JOURNAL OF APPLIED PHYSICS, 1993, 74 (08) :5149-5153
[2]   STOCHASTIC MODELING OF ELECTRICAL TREEING - FRACTAL AND STATISTICAL CHARACTERISTICS [J].
BARCLAY, AL ;
SWEENEY, PJ ;
DISSADO, LA ;
STEVENS, GC .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1990, 23 (12) :1536-1545
[3]   AN EXAMINATION OF THE EFFECT OF MECHANICAL-STRESS ON ELECTRICAL BREAKDOWN IN SYNTHETIC RESIN INSULATORS [J].
CHAMPION, JV ;
DODD, SJ ;
STEVENS, GC .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1994, 27 (01) :142-147
[4]   Simulation of partial discharges in conducting and non-conducting electrical tree structures [J].
Champion, JV ;
Dodd, SJ .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2001, 34 (08) :1235-1242
[5]   An approach to the modelling of partial discharges in electrical trees [J].
Champion, JV ;
Dodd, SJ .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1998, 31 (18) :2305-2314
[6]   An assessment of the effect of externally applied mechanical stress and water absorption on the electrical tree growth behaviour in glassy epoxy resins [J].
Champion, JV ;
Dodd, SJ .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1999, 32 (03) :305-316
[7]   A deterministic model for the growth of non-conducting electrical tree structures [J].
Dodd, SJ .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2003, 36 (02) :129-141
[8]   FILAMENTARY ELECTROMECHANICAL BREAKDOWN [J].
FOTHERGILL, JC .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1991, 26 (06) :1124-1129
[9]   CHARACTERISTICS OF DISCHARGE INSIDE SIMULATED TREE CHANNELS UNDER IMPULSE VOLTAGE [J].
GU, WY ;
LAURENT, C ;
MAYOUX, C .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1986, 19 (11) :2197-2207
[10]   Insulation morphology effects on the electrical treeing resistance [J].
Harlin, A ;
Shuvalov, M ;
Ovsienko, V ;
Juhanoja, J .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2002, 9 (03) :401-405