Neural network inversion for thickness measurements and conductivity profiling

被引：0
|
作者：
Katragadda, G
Wallace, J
Lee, J
Nair, S
机构：
来源：
REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 16A AND 16B | 1997年 / 16卷
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D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：781 / 788
页数：8
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