Efficient Design of Fault Tolerant Tiles In QCA

被引:0
|
作者
Sen, Bibhash [1 ]
Agarwal, Aman [1 ]
Nath, Rajdeep Kumar [1 ]
Mukherjee, Rijoy [1 ]
Sikdar, Biplab K. [2 ]
机构
[1] Natl Inst Technol, Dept Comp Sci & Engn, Durgapur 713209, WB, India
[2] Indian Inst Engn Sci & Technol, Dept Comp Sci & Technol, Howrah 711103, WB, India
来源
2014 ANNUAL IEEE INDIA CONFERENCE (INDICON) | 2014年
关键词
Quantum-dot cellular automata (QCA); Coupled majority minority gate; Fault tolerant tiles; QCA defects;
D O I
暂无
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
This work targets to explore the design of fault tolerant Quantum-dot Cellular Automata (QCA) tiles. A fault tolerant tile implementing majority logic (FTM) is realised which achieves 95.5% defect tolerance under single cell deposition. Also, two fault tolerant tiles around coupled majority minority (CMVMIN) are investigated in Quantum-dot cellular automata which realize majority and minority functions simultaneously. The characterization defective behaviour of fault tolerant tiles under cell deposition, cell misplacement and cell misalignment defects have been thoroughly investigated. The proposed fault tolerant tiles are found to be achieved fault tolerance of 88.88% and 88.23%. Efficient synthesis of symmetric functions based on such tile, further, establishes its effectiveness.
引用
收藏
页数:6
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