Write Scheme Allowing Reduced LRS Nonlinearity Requirement in a 3D-RRAM Array With Selector-Less 1TNR Architecture

被引:13
作者
Chen, Frederick T. [1 ]
Chen, Yu-Sheng [1 ]
Wu, Tai-Yuan [1 ]
Ku, Tzu-Kun [1 ]
机构
[1] Ind Technol Res Inst, Hsinchu 30010, Taiwan
关键词
RRAM; resistive memory;
D O I
10.1109/LED.2013.2294809
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 3-D resistive random access memory potentially offers lowest cost per bit and highest bit density memory architecture without the use of transistors in the array. However, without the use of selectors attached to each cell in the array, sneak currents are a key concern, causing signal errors, and excess power dissipation. A nonlinear LRS helps to resolve the issue, but to date, reported LRS nonlinearity values are still insufficient. In this letter, we describe how a 1TNR architecture may be designed and operated to take more advantage of the HRS rather than the LRS nonlinearity, allowing sneak currents to be minimized during write operations, without the use of cell selectors. We show how a recently studied TaOx/HfOx device with highly nonlinear (similar to 10(5)) HRS can be used in block sizes up to 256 Mb without selectors in a 1T8R architecture with a 25% current margin.
引用
收藏
页码:223 / 225
页数:3
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