Influence of elastic scattering on the neutron-induced single-event upsets in a static random access memory

被引：3

作者：

Arita, Y

Takai, M

Ogawa, I

Kishimoto, T

机构：

[1] Osaka Univ, Res Ctr Mat Sci Extreme Condit, Toyonaka, Osaka 5608531, Japan

[2] Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan

[3] Osaka Univ, Dept Phys, Toyonaka, Osaka 5608531, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2004年 / 43卷 / 9A-B期

关键词：

SRAM; single-event upset; fast neutron; elastic scattering;

D O I：

10.1143/JJAP.43.L1193

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Neutron single-event upsets (SEUs) induced by elastic scattering were investigated by an experiment using 2 MeV neutron beams and by a calculation based on scattering cross-section data and angular distribution data from the evaluated nuclear data file (ENDF). The SEU rates obtained by the calculation and experiment are in fairly good agreement if the region sensitive to the SEUs (sensitive volume) is properly defined. Adopting the calculation to atmospheric neutrons, the fraction of the SEU rates induced by elastic scattering accounted for approximately 26 to 32% of the total fast-neutron-induced SEUs in the atmospheric neutron environment. Reducing well depth will effectively reduce the number of SEUs.

引用

页码：L1193 / L1195

页数：3

共 8 条

[1]

[Anonymous], IEEE INT REL PHYS S

[2] Evaluation of fast neutron induced single event upset in a static random access memory and simulation by Monte Carlo N-Particle Code (MCNPX) [J].