Practical tests of a focal plane array detector microscope at the ANKA-IR beamline

被引：21

作者：

Moss, David ^{[1
]}

Gasharova, Biliana ^{[1
]}

Mathis, Yves-Laurent ^{[1
]}

机构：

[1] Forschungszentrum Karlsruhe, Synchrotron Light Source ANKA, D-76021 Karlsruhe, Germany

来源：

INFRARED PHYSICS & TECHNOLOGY | 2006年 / 49卷 / 1-2期

关键词：

synchrotron radiation; infrared spectroscopy; infrared microscopy; infrared imaging; focal plane array detector;

D O I：

10.1016/j.infrared.2006.01.033

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An infrared microscope equipped with a 64 x 64 pixel focal plane array detector was tested at the infrared beamline of the ANKA synchrotron facility. In contrast to expectations, it was found that the synchrotron beam could illuminate a usefully large area of the array detector while still delivering many times the intensity of illumination with a standard thermal source. The detector delivered excellent signal/noise ratio with a spatial resolution that would be perfectly adequate for many experiments. We conclude that synchrotron infrared microscopy beamlines should be equipped with focal plane array detectors in order to maintain their advantage with respect to similarly equipped benchtop instrumentation. (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：53 / 56

页数：4