Ultra-low-frequency self-oscillation of photocurrent in InxGa1-xAs/Al0.15Ga0.85As multiple-quantum-well p-i-n diodes

被引:1
作者
Satake, A [1 ]
Tanigawa, K
Kimura, T
Fujiwara, K
Sano, N
机构
[1] Kyushu Inst Technol, Kitakyushu, Fukuoka 8048550, Japan
[2] Kwansei Gakuin Univ, Nishinomiya, Hyogo 6620891, Japan
关键词
D O I
10.1063/1.1806268
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report an observation of ultra-low-frequency self-oscillation of photocurrent in InxGa1-xAs/Al0.15Ga0.85As multiple-quantum-well p-i-n diodes. The photocurrent intensity shows self-oscillations with a characteristic frequency of similar to0.1 Hz at low temperatures under reverse bias voltages. The photocurrent self-oscillation depends on applied bias voltage, temperature, illumination power, and indium content of quantum-well layers. These dependences indicate that the photocurrent self-oscillation is attributed to photogenerated carriers trapped in localized centers within InxGa1-xAs quantum-well regions. (C) 2004 American Institute of Physics.
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收藏
页码:3483 / 3485
页数:3
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