Gamma- and x-ray accelerated tin whisker development

被引：7

作者：

Oudat, Osama ^{[1
]}

Arora, Vidheesha ^{[1
]}

Ishmael Parsai, E. ^{[2
]}

Karpov, Victor G. ^{[1
]}

Shvydka, Diana ^{[2
]}

机构：

[1] Univ Toledo, Dept Phys & Astron, Toledo, OH 43606 USA

[2] Univ Toledo, Dept Radiat Oncol, Hlth Sci Campus, Toledo, OH 43614 USA

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2020年 / 53卷 / 49期

关键词：

whiskers; ionizing radiation; accelerated life testing; GROWTH; NUCLEATION; KINETICS; STRESS; CO-60;

D O I：

10.1088/1361-6463/abb38d

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We observed accelerated whisker development in thin tin films under non-destructive gamma-ray and x-ray irradiation sources. The effect is mediated by charges induced in glass substrates supporting films, and becomes significant reaching the characteristic range of radiation doses of 20-30 kGy. We were able to change the radiation induced whisker growth rate by electrically disconnecting some parts of our experimental setup, thus demonstrating the electrostatic nature of the whisker development. Subject to additional qualification trials, the observed acceleration factors suggest that ionizing radiation can be used for accelerated whisker propensity testing.

引用

页数：9

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