White-light continuum Z-scan technique for nonlinear materials characterization

被引：62
作者：
Balu, M
Hales, J
Hagan, DJ
Van Stryland, EW
机构：
[1] Univ Cent Florida, CREOL, Coll Opt & Photon, Orlando, FL 32816 USA
[2] Univ Cent Florida, FPCE, Orlando, FL 32816 USA
[3] Univ Cent Florida, Dept Phys, Orlando, FL USA
来源：
OPTICS EXPRESS | 2004年 / 12卷 / 16期
关键词：
D O I：
10.1364/OPEX.12.003820
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present a technique for rapid characterization of degenerate nonlinear absorption and refraction spectra using a femtosecond white-light continuum (WLC) pulse to perform Z-scans. The spectral components of the WLC source are temporally and spatially dispersed to minimize nondegenerate two-photon absorption (2PA) processes. We demonstrate the validity of the method by measuring the 2PA spectrum of a well-characterized semiconductor, ZnSe. (C) 2004 Optical Society of America.
引用
收藏
页码：3820 / 3826
页数：7
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