White-light continuum Z-scan technique for nonlinear materials characterization

被引：64
作者：
Balu, M
Hales, J
Hagan, DJ
Van Stryland, EW
机构：
[1] Univ Cent Florida, CREOL, Coll Opt & Photon, Orlando, FL 32816 USA
[2] Univ Cent Florida, FPCE, Orlando, FL 32816 USA
[3] Univ Cent Florida, Dept Phys, Orlando, FL USA
来源：
OPTICS EXPRESS | 2004年 / 12卷 / 16期
关键词：
D O I：
10.1364/OPEX.12.003820
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present a technique for rapid characterization of degenerate nonlinear absorption and refraction spectra using a femtosecond white-light continuum (WLC) pulse to perform Z-scans. The spectral components of the WLC source are temporally and spatially dispersed to minimize nondegenerate two-photon absorption (2PA) processes. We demonstrate the validity of the method by measuring the 2PA spectrum of a well-characterized semiconductor, ZnSe. (C) 2004 Optical Society of America.
引用
收藏
页码：3820 / 3826
页数：7
相关论文
共 14 条
[1]  
BALU M, 2004, CLEO C SAN FRANC MAY
[2]  
BELFIELD KD, 2001, ABSTR PAPERS AM CHEM, V218
[3]   Beam filamentation and the white light continuum divergence [J].
Brodeur, A ;
Ilkov, FA ;
Chin, SL .
OPTICS COMMUNICATIONS, 1996, 129 (3-4) :193-198
[4]   Highly efficient white light generation from barium fluoride [J].
Dharmadhikari, AK ;
Rajgara, FA ;
Reddy, NCS ;
Sandhu, AS ;
Mathur, D .
OPTICS EXPRESS, 2004, 12 (04) :695-700
[5]  
Gibbs H M., 1985, Optical Bistability. Controlling Light With Light
[6]   New technique for degenerate two-photon absorption spectral measurements using femtosecond continuum generation [J].
He, GS ;
Lin, TC ;
Prasad, PN .
OPTICS EXPRESS, 2002, 10 (13) :566-574
[7]   Experiment and analysis of two-photon absorption spectroscopy using a white-light continuum probe [J].
Negres, RA ;
Hales, JM ;
Hagan, DJ ;
Van Stryland, EW .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 2002, 38 (09) :1205-1216
[8]   DETERMINATION OF BOUND-ELECTRONIC AND FREE-CARRIER NONLINEARITIES IN ZNSE, GAAS, CDTE, AND ZNTE [J].
SAID, AA ;
SHEIKBAHAE, M ;
HAGAN, DJ ;
WEI, TH ;
WANG, J ;
YOUNG, J ;
VANSTRYLAND, EW .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1992, 9 (03) :405-414
[9]   HIGH-SENSITIVITY, SINGLE-BEAM N2 MEASUREMENTS [J].
SHEIKBAHAE, M ;
SAID, AA ;
VANSTRYLAND, EW .
OPTICS LETTERS, 1989, 14 (17) :955-957
[10]   SENSITIVE MEASUREMENT OF OPTICAL NONLINEARITIES USING A SINGLE BEAM [J].
SHEIKBAHAE, M ;
SAID, AA ;
WEI, TH ;
HAGAN, DJ ;
VANSTRYLAND, EW .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1990, 26 (04) :760-769
12