Quantitative detection of thermal barrier coating thickness based on simulated annealing algorithm using pulsed infrared thermography technology

被引：35

作者：

Bu, Chiwu ^{[1
]}

Tang, Qingju ^{[2
]}

Liu, Yuanlin ^{[2
]}

Yu, Fengyun ^{[2
]}

Mei, Chen ^{[2
]}

Zhao, Yawei ^{[3
]}

机构：

[1] Harbin Univ Commerce, Coll Light Ind, Harbin 150028, Peoples R China

[2] Heilongjiang Univ Sci & Technol, Sch Mech Engn, Harbin 150022, Peoples R China

[3] Univ Chinese Acad Sci, Coll Engn & Informat Technol, Beijing 100049, Peoples R China

来源：

APPLIED THERMAL ENGINEERING | 2016年 / 99卷

基金：

中国国家自然科学基金;

关键词：

Thickness quantitative detection; Thermal barrier coating; Simulated annealing algorithm; Pulsed infrared thermography;

D O I：

10.1016/j.applthermaleng.2016.01.143

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

Quantitative detection of thermal barrier coating thickness based on simulated annealing (SA) algorithm has been carried out using pulsed infrared thermography technology. The principle of quantitative detection of thermal barrier coating thickness was given, and the model of inverse heat conduction problem was built. The basic principle and implementation process of SA algorithm was described. The specimen with uneven coating thickness was detected using pulsed infrared thermography system, and the coating thickness was calculated using SA algorithm. Results show that when the coating thickness is 45 similar to 130 mu m, compared with eddy current testing results, the relative error is less than 10%, which proves the effectiveness of the coating thickness detection method proposed in this paper. (C) 2016 Elsevier Ltd. All rights reserved.

引用

页码：751 / 755

页数：5

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