Determination of L X-ray fluorescence parameters for Ho, Lu, W, Hg and Bi

被引：15

作者：

Turhan, M. F. ^{[1
]}

Durak, R. ^{[2
]}

Akman, F. ^{[3
]}

机构：

[1] Afyon Kocatepe Univ, Dept Med Imaging Tech, Ataturk Vocat Sch Hlth Serv, TR-03200 Afyon, Turkey

[2] Ataturk Univ, Dept Phys, TR-25240 Erzurum, Turkey

[3] Bingol Univ, Vocat Sch Tech Sci, Dept Elect Commun Technol, TR-12000 Bingol, Turkey

来源：

APPLIED RADIATION AND ISOTOPES | 2014年 / 89卷

关键词：

X-ray; Radiative transition; Level width; Fluorescence yield; Cross section; Vacancy transfer; VACANCY TRANSFER PROBABILITIES; COSTER-KRONIG PROBABILITIES; PRODUCTION CROSS-SECTIONS; LEVEL WIDTHS; TRANSITION-PROBABILITIES; YIELDS; SHELL; ELEMENTS; L-3; SUBSHELLS;

D O I：

10.1016/j.apradiso.2014.01.025

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

In this work, L X-ray fluorescence cross sections, L sub-shell fluorescence yields and level widths and radiative vacancy transfer probabilities of L sub-shells to M-i, N-i and O-i sub-shells were measured for the elements Ho, Lu, W, Hg and Bi. Energy dispersive X-ray fluorescence (EDXRF) technique was used to measure L X-ray photons. To obtain related parameters, we used 59.54 keV gamma photons of Am-241 radioactive point source. Emitted L X-ray photons from targets were collected by means of a Si(Li) detector with resolution of 180 eV at 5.9 keV. The present results are generally in a good agreement with theoretical calculations and the other results obtained in the literature, within their range considering experimental uncertainty. (C) 2014 Elsevier Ltd. All rights reserved.

引用

页码：151 / 158

页数：8

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