Fixed Pattern Noise Reduction and Linearity Improvement in Time-Mode CMOS Image Sensors

被引：10
|
作者：
Klosowski, Miron [1 ]
Sun, Yichuang [2 ]
机构：
[1] Gdansk Univ Technol, Fac Elect Telecommun & Informat, 11-12 Gabriela Narutowicza St, PL-80233 Gdansk, Poland
[2] Univ Hertfordshire, Sch Engn & Comp Sci, Hatfield AL10 9AB, Herts, England
来源：
SENSORS | 2020年 / 20卷 / 20期
关键词：
image sensor; fixed pattern noise; gain correction; offset correction; integral nonlinearity correction; time-mode ADC; ARRAY; OPTIMIZATION; ARCHITECTURE; DESIGN; ADC;
D O I：
10.3390/s20205921
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
In the paper, a digital clock stopping technique for gain and offset correction in time-mode analog-to-digital converters (ADCs) has been proposed. The technique is dedicated to imagers with massively parallel image acquisition working in the time mode where compensation of dark signal non-uniformity (DSNU) as well as photo-response non-uniformity (PRNU) is critical. Fixed pattern noise (FPN) reduction has been experimentally validated using 128-pixel CMOS imager. The reduction of the PRNU to about 0.5 LSB has been achieved. Linearity improvement technique has also been proposed, which allows for integral nonlinearity (INL) reduction to about 0.5 LSB. Measurements confirm the proposed approach.
引用
收藏
页码：1 / 16
页数：16
相关论文
共 50 条
  • [1] Temperature dependence of fixed pattern noise in logarithmic CMOS image sensors
    Joseph, Dileepan
    Collins, Steve
    2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5, 2007, : 2193 - +
  • [2] Transient response and fixed pattern noise in logarithmic CMOS image sensors
    Joseph, Dileepan
    Collins, Steve
    IEEE SENSORS JOURNAL, 2007, 7 (7-8) : 1191 - 1199
  • [3] Temperature Dependence of Fixed Pattern Noise in Logarithmic CMOS Image Sensors
    Joseph, Dileepan
    Collins, Steve
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2009, 58 (08) : 2503 - 2511
  • [4] Current Mode Image Sensor With Improved Linearity and Fixed-Pattern Noise
    Wu, Xiaotie
    Liu, Xilin
    Zhang, Milin
    Van der Spiegel, Jan
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2014, 61 (06) : 1666 - 1674
  • [5] Using Polynomials to Simplify Fixed Pattern Noise and Photometric Correction of Logarithmic CMOS Image Sensors
    Li, Jing
    Mahmoodi, Alireza
    Joseph, Dileepan
    SENSORS, 2015, 15 (10) : 26331 - 26352
  • [6] Fixed Pattern Noise and Temporal Noise Degradation Induced by Radiation Effects in Pinned Photodiode CMOS Image Sensors
    Wang, Zujun
    Xue, Yuanyuan
    Chen, Wei
    He, Baoping
    Yao, Zhibin
    Ma, Wuying
    Sheng, Jiangkun
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 65 (06) : 1264 - 1270
  • [7] Noise Power Spectrum Estimation of Column Fixed Pattern Noise in CMOS Image Sensors Based on AR Model
    Yu, Ting
    Fu, Guicui
    Qiu, Yao
    Wang, Ye
    2019 PROGNOSTICS AND SYSTEM HEALTH MANAGEMENT CONFERENCE (PHM-QINGDAO), 2019,
  • [8] A UWB CMOS low-noise amplifier with noise reduction and linearity improvement techniques
    Jafari, Babak Mazhab
    Yavari, Mohammad
    MICROELECTRONICS JOURNAL, 2015, 46 (02) : 198 - 206
  • [9] EMI Effects in CMOS Time-Mode Circuits
    Richelli, Anna
    Colalongo, Luigi
    Kovacs-Vajna, Zs. M.
    PROCEEDINGS OF THE 2020 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC EUROPE), 2020,
  • [10] A numerical analysis of a CMOS image sensor with a simple fixed-pattern-noise-reduction technology
    Yonemoto, K
    Sumi, H
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2002, 49 (05) : 746 - 753
12345