Isolation of III-V/Ge Multijunction Solar Cells by Wet Etching

被引:5
|
作者
Turala, A. [1 ,2 ]
Jaouad, A. [1 ,2 ]
Masson, D. P. [3 ]
Fafard, S. [3 ]
Ares, R. [1 ,2 ]
Aimez, V. [1 ,2 ]
机构
[1] Univ Sherbrooke, Inst Interdisciplinaire Innovat Technol 3IT, Sherbrooke, PQ J1K OA5, Canada
[2] Univ Sherbrooke, Lab Nanotechnol Nanosyst CNRS UMI LN2 3463, Sherbrooke, PQ J1K OA5, Canada
[3] Cyrium Technol Inc, Ottawa, ON K2K 2M5, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
GAAS; DEPOSITION;
D O I
10.1155/2013/583867
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Microfabrication cycles of III-V multijunction solar cells include several technological steps and end with a wafer dicing step to separate individual cells. This step introduces damage at lateral facets of the junctions that act as charge trapping centers, potentially causing performance and reliability issues, which become even more important with today's trend of cell size reduction. In this paper we propose a process of wet etching of microtrenches that allows electrical isolation of individual solar cells with no damage to the sidewalls. Etching with bromine-methanol, the solution that is typically used for nonselective etching of III-V compounds, results in the formation of unwanted holes on the semiconductor surfaces. We investigate the origin of holes formation and discuss methods to overcome this effect. We present an implementation of the isolation step into a solar cell fabrication process flow. This improved fabrication process opens the way for improved die strength, yield, and reliability.
引用
收藏
页数:7
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