Investigations of optical and surface properties of Ag single thin film coating as semitransparent heat reflective mirror

被引：13

作者：

Domaradzki, J. ^{[1
]}

Kaczmarek, D. ^{[1
]}

Mazur, M. ^{[1
]}

Wojcieszak, D. ^{[1
]}

Halarewicz, J. ^{[2
]}

Glodek, S. ^{[2
]}

Domanowski, P. ^{[3
]}

机构：

[1] Wroclaw Univ Technol, Fac Microsyst Elect & Photon, Wyspianskiego 27, PL-50370 Wroclaw, Poland

[2] BOHAMET SA, Torunska 2, PL-86005 Ciele, Poland

[3] Univ Technol & Life Sci Bydgoszcz, Fac Mech Engn, Kaliskiego 7, PL-85796 Bydgoszcz, Poland

来源：

MATERIALS SCIENCE-POLAND | 2016年 / 34卷 / 04期

关键词：

optical coating; optical properties; heat reflective mirror; surface analysis;

D O I：

10.1515/msp-2016-0102

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The paper presents results of optical and surface morphology investigations of semitransparent silver single thin films deposited on glass substrate in relation to their heat radiation treatment. The thickness of 15 nm for the silver thin films was selected using computer designing of optical spectra and the films were deposited using electron beam evaporation process. Optical transmission and reflection were investigated for as deposited samples and after exposition to heat radiation from quartz-halogen lamp. The changes in the optical spectra were observed which suggested degradation of deposited heat mirrors. Structure and surface morphology studies performed using scanning electron microscopy, X-ray photoelectron spectroscopy and atomic force microscopy allowed us to conclude about formation of nanometric silver islands, regularly distributed over the surface of the glass substrate after exposure to heat treatment.

引用

页码：747 / 753

页数：7

共 8 条

[1] [Anonymous], FILMSTAR DES SOFTW
[2] Crist B.V., 1999, Handbook of Monochromatic XPS spectra, Mountain View
[3] Design of low emissivity systems based on a three-layer coating
Grosse, P
Hertling, R
Muggenburg, T
[J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1997, 218 : 38 - 43
[4] WSXM:: A software for scanning probe microscopy and a tool for nanotechnology
Horcas, I.
Fernandez, R.
Gomez-Rodriguez, J. M.
Colchero, J.
Gomez-Herrero, J.
Baro, A. M.
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (01)
[5] MacLeod A.H., 2001, Thin-Film Optical Filters
[6] Moulder J.F., 1979, HDB XRAY PHOTOELECTR
[7] WOJCIESZAK D., 2016, MAT SCI POL IN PRESS, V4
[8] WOJCIESZAK D., 2016, MAT SCI E C IN PRESS

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