Temperature Effects on Energy Optimization in Sub-Threshold Circuit Design

被引:8
作者
Datta, Basab [1 ]
Burleson, Wayne [1 ]
机构
[1] Univ Massachusetts, Dept Elect & Comp Engn, Amherst, MA 01003 USA
来源
ISQED 2009: PROCEEDINGS 10TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, VOLS 1 AND 2 | 2009年
关键词
D O I
10.1109/ISQED.2009.4810375
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Sub-threshold circuits have emerged as a strong candidate for use in future energy-constrained applications. In a non-homogeneous design paradigm containing both sub-threshold and high power-density super-threshold blocks, it becomes imperative to examine the thermal effects on sub-threshold operation. In this paper, we investigate the thermal impact on sub-threshold current, delay and energy and develop analytical models of the same. Unlike super-threshold, the sub-threshold ION increases exponentially with temperature while the I-ON-to-I-OFF ratio degrades by 0.52%degrees C. While delay decreases, energy increases with temperature due to relative increase in leakage power at the higher temperatures. Studies performed on noise-margins, current/delay variability and sub-V-th interconnects suggest that sub-V-th circuits can retain {power, delay, energy} optimality over a relatively high temperature range of 25-75 degrees C.
引用
收藏
页码:680 / 685
页数:6
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